Jiang, Haina
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Vol 42, No 3 (2018) - Technical papers
Defect Features Recognition in 3D Industrial CT Images
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Matjaz Gams
N. and S. America:
Karthick Gunasekaran
Asia, Australia:
Vinay Singh
Overview papers:
Maria Ganzha
Wiesław Pawlowski
Aleksander Denisiuk Abstacting / Indexing
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COBISS
Compendex
Computer & Information Systems Abstracts
Computer Database
Computer Science Index
dLib.si
DBLP Computer Science Bibliography
Directory of Open Access Journals
Google Scholar
InfoTrac OneFile
Inspec
Linguistic and Language Behaviour Abstracts
Mathematical Reviews, MatSciNet, MatSci on SilverPlatter and Current Mathematical Publications
Scopus Publishing
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